The basic divergence optic is the slit optic. It includes divergence slits for 1°, 2° and 3° divergence, and the primary
beam Soller slit. The very narrow receiving slits can be fitted for special applications.
The optional monolithic optic “X-ray Lens” from XOS®. This monolithic optic is ideal for off-axis specimen alignment applications such as Texture and Residual Stress. The 6 mm dia. beam is supplied as standard. The large (10 mm dia.beam) as shown is available as an option.
A unique optic for large d-spacings and less ordered materials.It produces a thin beam from a narrow gap between optically flat plates, resulting in excellent efficiency for less ordered materials.
Available in Cu or Co monochromators. (The Cu monochromator is standard with the basic Emma package. Both monochromators utilise a special Xe proportional detector tube and low-noise preamp (linear to >90000 cps). A receiving slit, secondary Soller slit and scatter slit all work together to improve the resolution and shape of the measured peaks.
This includes a long soller slit collimator of 0.4° acceptance angle, and an Xe proportional detector with a large window detector tube. This is essential for parallel beam use, as the Bragg angle is defined by the Soller collimator. It is used with the Polycapillary Optic.
Uniquely allows both focussing and parallel beam detectors and optics to be permanently mounted. Changeover between them is simply done in software.
High speed multi-strip solid state detector for rapid scans with high intensity and resolution. The detector has 96 channels with a pitch of 120 μm subtending 0.06° at 200 mm radius. With a maximum count rate of 5 x 106 per strip it supports scan speeds up to 120°/minute over an energy range from 4.5 to 17 keV with an energy resolution better than 10%.
The standard stage takes the standard 2 inch diameter sample holders, which are spring loaded against height setting pegs precisely adjusted to the goniometer axis.
A variation on the standard stage; it holds the sample holders up against small ball-bearing rollers which are precisely adjusted to height. Spinning reduces preferred orientation effects, and is stepper motor driven.
This stage can also be used for bulk sample applications and can take ingots up to 52 mm diameter and 100 mm long.
Used with parallel beam detector and optic. Allows data collection in Debye-Scherrer geometry in sealed capillaries or to minimise preferred orientation.
This stage is for bulk samples and can take large samples up to 150 mm diameter x 20 mm thick. Translation and rotation allows access to the whole surface.
The 10 sample Autoloader includes the option to spin in the analysis position. Random access to any position makes it convenient for permanent mounting and/or use for single samples.
Allows setting of temperatures up to 1600°C in Vacuum with precise and rapid temperature setting. Software allows setting up of an automated temperature ramping and repeat scan sequence.
Also available is the PAAR TTK-450 Low Temperature stage, with air jet cooling, which allows temperature setting from -10°C to +450°C without cryogenics.
Stepping motor driven auto slits mount in the divergence and matching scatter slit positions to give constant irradiated area on the sample. They open and close with Theta angle.
Essential for Pole Figure data collection and preferable for Residual Stress work. It has a slim cross section, so has minimum obscuration of the detector and maximum available angle.
Automation Software
Of course no hardware control system is complete without comprehensive control and data analysis software. Operating in the Microsoft Windows® environment are two 32 bit software packages; Visual XRD and Traces.
Visual XRD provides control of hardware function of the 122E automation module and XRD system and enable the data acquisition. All scan modes and computer aided setup are available.
A range of detector and monochromator options are also available. Complementary software packages are available for integration with Traces. These are DSearch, Siroquant, Index and Unit Cell.
